On to TechEd ’04

I just got the word today, I will be heading to TechEd ’04!  I am looking forward to hearing how working with the .NET Framework is going and what you think of the great new stuff in Whidbey.  What are you looking forward to at TechEd?


If your company is doing serious development with V1.0 or V1.1 of the .NET Framework and you have some feedback or ideas you’d like to give directly to the CLR product team please let me know, we will see what we can arrange.  Although we know that most really good issues span product teams you should be aware that the CLR includes mostly low level engine and library issues such as interop, security, memory management, general managed code performance, and the lowest level libraries including reflection, collections, IO, base data types, etc. 

Comments (4)

  1. Chris Conti says:

    1. We still have a lot of COM interop to deal with, and I don’t see it going away anytime soon. I’ve always found it to be a disconcerting omission (unless you consider the political aspects of forcing developers toward newer tech) that there is no IDL compiler that produces IL/C#, at least for automation compliant types a’la the universal marshaler. TLBImp seems like a huge hack since so much information is lost in the IDL->TLB process.

    2. This is probably more of a winforms issue than general interop, but why are all of the Win32 msg/structure etc. definitions only available as internal members of System.Windows.Forms? How many people have had to define their own versions of WM_LBUTTONDOWN or RECT?

  2. Chris – I have answered your second question in my blog – http://blogs.msdn.com/rprabhu/archive/2004/03/25/96135.aspx

  3. Andy Ball says:

    Having just left Sydney, Australia. I’m looking forward to jumping on a boat from my hotel to the conference each morning as well 5 days of geeking out. The session mix looks really good this year with a good balance of existing (ie SQL 2k) and new technology covered.

  4. Chris – I have answered your second question in my blog –

Skip to main content